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Best Practices Webinar: DC Measurements Semiconductor Test

DC measurements are pervasive throughout semiconductor characterization, validation, and production, regardless of specific device-under-test functionality.

Parasitic loading, noise, and drift challenges can lead to uninformed design decisions, quality issues, and increased test costs. In this webinar, you will learn best practices to optimize measurement quality of four-quadrant and one-quadrant DC instrumentation, such as source measure units or programmable power supplies.

Key takeaways

  • Learn best practices to optimize measurement quality of four-quadrant and one-quadrant DC instrumentation, such as source measure units or programmable power supplies

Who Should Attend

  • Test Engineering Manager/Director, or Sr. Test Engineer for a semiconductor characterization lab

 

 

 

Wednesday, September 11
11:00 AM – 12:00 PM
(GMT+02:00) Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna

Registration

If you would like to take part in NI's webinar, please register here.

Veranstaltungsort
Webinar


Veranstalter

Tarek Safwan
National Instruments
tarek.safwan@ni.com

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