Aktuelle Veranstaltungen

20th European Advanced Process Control and Manufacturing (apc|m) Conference

The 20th European Advanced Process Control and Manufacturing (apc|m) Conference is directed to manufacturers, suppliers and scientific community of semiconductor, photovoltaic, LED, flat panel, MEMS, and other related industries. The topics are focused on current challenges and future needs of Advanced Process Control and Manufacturing Effectiveness.

CALL FOR PAPERS STARTS ON JUNE 01, 2021

Schedule
Call for AbstractsJune 01, 2021 - October 17, 2021
Evaluation of abstractsOctober 18, 2021 - November 21, 2021
Preparation of programNovember 22, 2021 - December 05, 2021
Program onlineDecember 06, 2021

The European apc|m Conference will be built around sessions of following topics:

Process Level APC

  • Plasma etch, CVD and ALD
  • Sputtering, P3I, and e--beamLithography
  • Thermal, wet processing & CMP
  • Backend
  • Metrology and R2R
  • APC for legacy tools

Fab Level APC

  • Digitization, data analytics, machine learning & AI, digital twin
  • Fab level process control methods
  • Virtual metrology
  • Yield management
  • Factory data analysis
  • IT infrastructure & Equipment integration trends

Manufacturing Effectiveness and Productivity

  • Unit process & equipment productivity
  • Factory productivity and automation
  • Factory modeling, simulation and optimization
  • Cost optimization and end-of-life equipment issues
  • Environment and Green Manufacturing

With the Blind Bird we offer you discounted tickets without knowing the program. From December, 06, 2021 the program will be published and then the Early Bird price applies. For the registration our general terms and conditions apply!

Ansprechpartner

Isabel Dietrich
Silicon Saxony e. V.
Telefon: +49 351 89 25 885
Fax: +49 351 89 25 889
E-Mail: event@silicon-saxony.de

René Weber
apc|m Conference
Telefon geschäftlich: +49 (0) 351 - 8925 887
Fax: +49 (0) 351 - 8925 889
E-Mail: weber@apcm-europe.eu
http://www.apcm-europe.eu/home.html

Zurück zur Übersicht